Angstrom Scientific Loans Scanning Electron Microscope to North Penn High School Engineering Academy
Students experiment with Hitachi TM3000
 

Lansdale, Pennsylvania—April 5 , 2011—Students in the North Penn High School Engineering Academy course named
The Future is N.E.A.R. (Nanotechnology Education And Research) recently met with Evan Slow from Angstrom Scientific to utilize their TM3000 Scanning Electron Microscope.

Evan Slow spent an entire afternoon with Mr. Boyer and his students training them on the proper operation of the instrument and then allowed them to utilize it in their laboratory for the next week.  Students spent the next several days, including an entire day in the laboratory on Saturday, April 2nd, working with the SEM and collecting important data for their research experiments. 

"The SEM is an essential tool for the nanotechnology course because it gives the students an opportunity to observe, analyze, and interpret what can not be seen with the naked eye - even with the best optical microscope.  Furthermore, it can be utilized in so many other courses ranging from science and engineering to math, history, and even English courses when teaching creative writing", Boyer stated.  "If we want to truly give our students a competitive edge in this global economy, we should be teaching them cutting edge curricula with essential tools to help prepare them for their future."

Please check back often to The Future is NEAR website for updates and information regarding the upcoming presentation of the students' research endeavors.

 

Angstrom Scientific Inc., based in Ramsey, New Jersey, is dedicated to helping the nanotechnology marketplace characterize, develop, monitor and control their critical processes.  Their main focus is to bring to the market products and services focused on measurement and control of critical processes at the nanoscale level.

  Images taken in class from the Hitachi TM3000 SEM
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Hitachi TM3000
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02: Students at work analyzing nanofibers produced in class.
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03: Anther and pollen at 200X
 
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01: Pea plant flower
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02: Stamen placed on scanning electron microscope stub
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03: Anther and pollen at 200X
 
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04: 7408 AND gate Integrated circuit
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05: 7408 AND gate Integrated circuit
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06: 7408 AND gate Integrated circuit
 
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07: 7408 AND gate Integrated circuit - Shorted out
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08: 7408 AND gate Integrated circuit - Shorted out
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09: 7408 AND gate Integrated circuit - Shorted out
 
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10: EDS - X-ray Analysis
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11: Diatomaceous Earth
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12: Diatomaceous Earth
 
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13: Diatomaceous Earth
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14: Student team -  AMTI - Polyvinylidene Fluoride - piezoelectric nanofibers
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15: Student team -  Ezo Products - Polyvinylidene Fluoride - piezoelectric nanofibers
 
   
  Reporteronline.com video
 
http://www.clipsyndicate.com/video/play/2363723/scanning_electron_microscope
 
 
 
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